Higher 4K+ Resolution and Microscopic Surface Defect Detection: Featuring a 9-Megapixel imager, this series delivers up to 4192 points per profile for high-resolution measurement and inspection. It generates profile and surface data at up to 2.5 microns X resolution for in-line dimensional measurement and microscopic surface defect detection on small parts , while offering expansive fields of view up to 2 m to scan larger targets in a single pass.

New High Dynamic Range (HDR) Mode for Faster Cycle Times: The new High Dynamic Range (HDR) Mode significantly improves scan quality on challenging targets that previously were susceptible to over or underexposed features, such as highly reflective metallic surfaces and objects with a variety of materials and finishes. Challenging features that previously required multiple exposures may now be captured with a single exposure and faster cycle time.

Faster Default Scan Speed and Enhanced Data Quality: Remastered and optimized to provide higher default scan speeds , the series features a specialized pre-processing pipeline to reduce spatial noise and optimize surface flatness. This enhanced data quality allows users to more accurately locate, measure, and identify features on a variety of targets and applications.